Smart handoff technique for internet of vehicles communication using dynamic edge-backup node
Authors
Awan, Khalid MahmoodNadeem, Malik
Sadiq, Ali Safaa
Alghushami, Abdullah
Khan, Imran
Rabie, Khaled
Issue Date
2020-03-23
Metadata
Show full item recordAbstract
A vehicular adhoc network (VANET) recently emerged in the the Internet of Vehicles (IoV); it involves the computational processing of moving vehicles. Nowadays, IoV has turned into an interesting field of research as vehicles can be equipped with processors, sensors, and communication devices. IoV gives rise to handoff, which involves changing the connection points during the online communication session. This presents a major challenge for which many standardized solutions are recommended. Although there are various proposed techniques and methods to support seamless handover procedure in IoV, there are still some open research issues, such as unavoidable packet loss rate and latency. On the other hand, the emerged concept of edge mobile computing has gained crucial attention by researchers that could help in reducing computational complexities and decreasing communication delay. Hence, this paper specifically studies the handoff challenges in cluster based handoff using new concept of dynamic edge-backup node. The outcomes are evaluated and contrasted with the network mobility method, our proposed technique, and other cluster-based technologies. The results show that coherence in communication during the handoff method can be upgraded, enhanced, and improved utilizing the proposed technique.Citation
Awan, K.M.; Nadeem, M.; Sadiq, A.S.; Alghushami, A.; Khan, I.; Rabie, K. (2020) Smart Handoff Technique for Internet of Vehicles Communication using Dynamic Edge-Backup Node. Electronics 2020, 9, 524.Publisher
MDPI AGJournal
ElectronicsAdditional Links
https://www.mdpi.com/2079-9292/9/3/524Type
Journal articleLanguage
enDescription
© 2020 The Authors. Published by MDPI. This is an open access article available under a Creative Commons licence. The published version can be accessed at the following link on the publisher’s website: https://doi.org/10.3390/electronics9030524ISSN
2079-9292EISSN
2079-9292ae974a485f413a2113503eed53cd6c53
10.3390/electronics9030524
Scopus Count
Collections
Except where otherwise noted, this item's license is described as https://creativecommons.org/licenses/by/4.0/